CORDIS Project
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The project introduces Secondary-Electron Electron-Beam-Induced Current (SEEBIC) for high-resolution imaging of nanoparticles. This innovative technique enhances the capabilities of Transmission Electron Microscopy, enabling detailed morphological characterization crucial for nanomaterial research.
The properties of nanomaterials are essentially determined by their size and three-dimensional (3D) structure, typically assessed by Electron Microscopy (EM) techniques such as Scanning Electron Microscopy or Electron Tomography.
Unfortunately, the spatial resolution of SEM is limited and ET suffers from low temporal resolution.
Here, we present an alternative approach “Secondary-Electron Electron-Beam-Induced Current (SEEBIC)”, a technique during which a dedicated Transmission Electron Microsco…
UNIVERSITEIT ANTWERPEN
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