CORDIS Project
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This project focuses on the geometrical characterization of microstructured coatings using advanced optical measurement techniques. It aims to enhance measurement precision and develop real-time monitoring solutions for industrial applications.
For a successful geometrical characterization of the described microstructured coatings, the lateral resolution of the measurement device should be higher than 250 nm.
Therefore, a confocal microscope or white light interferometer will be used for the laboratory measurements.
To obtain reliable and accurate geometrical information, the optical measurement results will be verified by a secondary electron microscope (SEM).
Its advantage is the higher lateral resolution and the ability to detect st…
GOTTFRIED WILHELM LEIBNIZ UNIVERSITAET HANNOVER
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