Closed call · historical referenceTests and Modelling for reliability characterization and robustness of optoelectronic transceivers for optical SHM systemsHorizon 2020Horizon 2020Tests and Modelling for reliability characterization and robustness of optoelectronic transceivers for optical SHM systemsTopicsCountry:eu WideEligible:BusinessEligible:research CenterEligible:UniversityFunding Size:unknownOpportunity Kind:project GrantOpportunity Type:grantSource:FTTiming:UnknownInnovation GeneralPartner typesbusiness, research_center, universityOfficial portalExplore relatedTopicscountry:EU_WIDEeligible:businesseligible:research_centereligible:universityfunding_size:unknownopportunity_kind:project_grantopportunity_type:grantsource:FT
